Artikelbeschreibung
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
Produktsicherheit
| Hersteller: | Springer Nature Customer Service Center GmbH |
| Anschrift: |
Europaplatz 3 DE-69115 Heidelberg |
| Kontakt: | ProductSafety@springernature.com |
Pressestimmen
"...this book is both linguistically and scientifically outstanding. It is an inspiring book for beginners and experienced SEM operators alike. The list of references is especially useful. This volume makes an outstanding contribution to the deeper understanding of the SEM."
T Mulvey, Measurement Science and Technology. 11, No12, December 2000
Unsere Bestseller
Bewertungen
Die Bewertungen werden vor ihrer Veröffentlichung nicht auf ihre Echtheit überprüft. Sie können daher auch von Verbrauchern stammen, die die bewerteten Produkte tatsächlich gar nicht erworben/genutzt haben.